
- Spatial resolution, 190 kV nanofocus mode
- ≤ 0.9 µm
- Microfocus mode, 350 W
- 225 kV
- Sample size, microfocus mode
- ø 300 × 250 mm
- Density resolution, microfocus mode
- ≤ 0.5%
Overview
Sub-micron detail. One cabinet.
Particles, fibres, bond wires and solder joints need resolution below a micrometre. The RMCT2000 delivers it for small samples, in a cabinet that fits a laboratory.
Two configurations are available: a 190 kV nanofocus mode for the finest detail and a 225 kV microfocus mode for larger and denser samples.
The sample chamber is small by design. For parts above ø 300 × 250 mm, the RMCT4000 is the right system.
Features
Resolution first.
See below a micrometre
Resolve the smallest structures. The 190 kV nanofocus mode reaches a spatial resolution of 0.9 µm or better, on a detector with 49.5 µm pixels and 4608 × 5890 pixels.
Switch to more power
Scan larger and denser samples in the same family. The 225 kV microfocus mode works with 350 W and a JIMA resolution of 2 µm, for samples up to ø 300 × 250 mm and 15 kg.
Suppress artefacts
Choose the scan for the sample. Both modes offer circular and jitter scans on a granite main frame.
Versions
2 versions, one platform.
RMCT2000
The base version: 2D resolution 2.5 µm, 3D resolution 3 µm.
RMCT2000HR
The high-resolution version: 2D resolution 0.5 µm, 3D resolution 1 µm.
Specifications
Technical data.
| 190 kV nanofocus mode | |
|---|---|
| X-ray source | 190 kV, 50 W |
| Spatial resolution | ≤ 0.9 µm |
| Detector | 228 × 291 mm, 49.5 µm pixels, 4608 × 5890 |
| Sample | ø 200 × 225 mm maximum, ø 140 × 155 mm scannable, 5 kg |
| System | 2100 × 1200 × 1770 mm, 2.68 t |
| 225 kV microfocus mode | |
| X-ray source | 225 kV, 350 W, JIMA resolution 2 µm |
| Detector | Amorphous-silicon flat panel, 427 × 427 mm, 139 µm pixels, 3072 × 3072 |
| Sample | ø 300 × 250 mm, 15 kg |
| Density resolution | ≤ 0.5% |
| System | 2863 × 1226 × 2151 mm, 3.0 t |
| Both modes | |
| Scan modes | Circular, jitter |
| Main frame | Granite |
| Power | 220 V, 50 Hz, 7.5 kW |
| Radiation leakage | ≤ 1 µSv/h |
Applications
Where it is used.
Particles, pores, fibre orientation, bond wires, solder joints and cracks in small samples.
Downloads
Data sheet on request.
We send the current RMCT2000 data sheet together with a first assessment of your part.