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Application note

Application notes.

One inspection task per note: the part, the method and what the data shows.

CT volume rendering of a QFP package showing the gull-wing leads on all four sides

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Royma RMPCT5500 brings inline planar CT to IC-substrate and advanced packaging lines

CT image of an electronic package with voids in the die-attach layer and lead-frame contacts

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Royma RMCT2000HR brings sub-micron CT to hybrid bonding void inspection

CT slice of a fibre-reinforced composite laminate with delamination between plies and a fracture marked, 500 µm scale bar

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Royma CT inspection of launcher structures: welds, bond lines and composites

CT surface rendering of a metal part with wall-thickness and angle measurements annotated along a curved section

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Royma RMCT4000 brings additive manufacturing CT for porosity and CAD checks to aerospace parts

CT image of internal porosity in an additively manufactured metal sample

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RMCT10000 delivers a CT scan of the entire sample for titanium additive-manufactured parts before machining

Inline 3D CT overhang measurement per electrode in a prismatic cell

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Why 2D X-ray misses prismatic-cell overhang faults – and what 100% inline 3D CT changes for LFP and ESS cell lines

CT rendering of porosity in a cast aluminium block, colour-coded by pore size

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Proving porosity, core-shift and wall-thickness control as foundries move to printed sand cores

3D CT rendering of a prismatic battery cell in its cartridge

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Beyond the electrode stack: CT of top-cover laser welds, safety valves and seal balls on prismatic cells

X-ray image of a PCB layer showing vias and traces

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From 2D AXI to inline 3D planar CT: inspecting 20-layer HDI boards and back-drilled vias in production

CT image of a prismatic cell with electrode overhang classified and measurement overlay

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From sorting to fixing: how 100% inline cell CT feeds defect data back to the stacking line

CT measurement of electrode overhang in a prismatic cell, colour-coded by algorithm

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Forecasting the ROI of 100% inline cell CT: how to measure your own false-reject and escape rates before you buy

X-ray image of a QFP package showing the die and its wire bonds

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Seeing inside advanced semiconductor packages before they leave the lab

X-ray image of a power-module solder layer showing voids

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Power electronics for the data-centre boom need X-ray eyes on every joint

X-ray image of a battery module with glue-line areas marked

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Module-level CT for gigafactory module and pack lines: glue coverage, busbars and cell position at line speed

X-ray image of micro-bumps and solder balls in an advanced package, showing voids

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Sub-micron CT for advanced packaging: voids, micro-bumps and wire bonds in HBM and chiplet lines

3D CT rendering of solder balls in an electronic assembly

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New semiconductor fabs and equipment plants need inspection designed in from day one

CT image of cathode material particles at sub-micron resolution

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Cathode-material recycling and battery pilot lines need sub-micron CT, not just lab analytics

Let’s solve your inspection challenge.

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